Information Technologies and Computer Engineering

One of the important areas of digital measurement technology is the creation and use of analog-to-digital converters (ADCs), which are components of information and measuring systems, information and computing complexes, various measuring tools and devices. To solve the issue of using a particular ADC in a particular task, it is necessary to determine static and dynamic characteristics. There are a number of methods for determining the conversion characteristics (CP) of the ADC [1]. The vast majority of them use constant voltage levels as test voltages (only the amplitude-frequency characteristic is determined on the basis of a sinusoid). It is obvious that to assess the quality of the ADC functioning when converting fast-moving processes, it is not enough to know only static characteristics. In most cases, it is necessary to determine the CP of the ADC in dynamic mode. Further improvement of the accuracy of the ADC in dynamic mode is hampered by the lack of effective methods for determining the dynamic characteristics of the ADC. In this regard, the task of developing a method for determining the conversion characteristics of the ADC in dynamic mode is relevant.

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